The International Magazine for Device and Wafer-Level Test, Assembly, and Packaging Addressing High-density Interconnection of Microelectronic IC's including 3D packages, MEMS, MOEMS, RF/Wireless, Optoelectronic and Other Wafer-fabricated Devices for the 21st Century
Current Issue: September - October 2014
  • Suitability of Cu wire bonded ICs for automotive applications
  • Encapsulated WLCSP
  • Evolution of wafer dicing
  • Lowering the cost of MEMS
  • Die attach solutions for thin die applications
  • Reliable testing of Cu pillar technology for smart devices
  • High-reliability via interconnections in glass wafers for 2.5D
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IWLPC 2014 Gold Sponsors
CSR Advertisers Stock Index
SymbolNameLastPct
Change
MMM3M Company152.100.72
AMKRAmkor Technology5.97-2.29
AMATApplied Materials21.34-0.63
EMNEastman Chemical75.771.68
HONHoneywell Intl.95.590.57
NEWPNewport Corp.17.03-9.99
NDSNNordson Corp.75.590.48
RTECRudolph Tech8.72-2.57
STSensata Tech47.590.85
SMGZYSmiths Group PLC18.432.11

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