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On Line Reader Service
 Publisher's Letter
A Remembrance of Things Past

 Assembly Lines
Don't Miss This Industry Nostalgia Quiz - You've Had 1-1/2 Years to Study for It!

 On Test
Will the Last Person Off the Test Floor Please Turn Out the Lights!

 Industry News
Company News
Semicon West 2001 Album
People in the News
Inspection, Test & Measurement
Letter to the Editor
Packaging Foundries
Literature Review
Calendar of Events
Editorial Index

 Features
Cover Story: Prime Cuts - What Users Want in Singulation Tools
Singulation Equipment Provider Directory

Environmental Testing for Portable and Hand-Held Electronics

The Experts Look At the Issues: Packaging Automotive ICs

 Technical Forum
Bond Integrity: Trade-Offs Between Electrical, Thermal and Mechanical Performance

Equipment Considerations for Flip-Chip Packaging

How Trace Amounts of Lead May Impact a Lead-Free Composition of Sn/Ag/Bi/In Solder

 Tutorial
X-Ray Inspection of IC Packages and PWBs

 Tools & Technologies
Kulicke & Soffa Introduces New Products and more...

 Patents
Hyundai Lead-on-Chip CSP Fabricated with Several Layers of Flexible Circuits

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Current Issue
An Independent Journal Dedicated to the Advancement of Chip - Scale Electronics
August - September 2001
Inspection, Test & Measurement
Aries Electronics' BGA/CSP hybrid socket

Aries Electronics Inc. Debuts 'Unique' Hybrid Sockets for BGA and CSP Formats

Frenchtown, N.J.-Aries Electronics has introduced a hybrid socket featuring a "unique" spring-type contact for use with BGA and CSP applications.

The sockets are available with pitches of 1.0 mm and above for BGAs and as low as 0.5 mm for CSPs.

The socket employs four threaded inserts for bolting the cover to the socket base. (Cover-attach screws are provided with the socket.) The socket housing also contains two locating pins to align the socket contacts precisely to the target board pads.

Each socket is matched to the BGA device to ensure a perfect fit. Pricing for prototype quantities is from $0.10-$0.20/contact with delivery 4-6 weeks ARO. [arieselec.com]

FeinFocus Announces F.O.X. Nanofocus X-Ray Inspection

Stamford, Conn.-FeinFocus USA Inc. has introduced the industry's first nanofocus X-ray inspection system for sub-micron defect detection.

Known as the F.O.X. (FeinFocus Opti-mized X-ray) system, the unit combines high resolution X-ray technology with advanced optics.

The system offers total magnification up to 7,200x (2,400 geometric magnification) and feature recognition of 500 nm (0.5 microns), which the company says makes it ideal for PWB and IC makers to employ for real time inspection of a range of package types and bond wires.

The unit is suitable for detailed inspection of samples up to 300 mm x 400 mm that weigh up to 10 kg. [feinfocus.com]

 
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