September 1998 - ChipScale Review

September 1998


eMail the Editor

ICOS Enhances CSP Inspection

ICOS Vision Systems has introduced enhanced component inspectors, the CI-8250 and CI-3050 to meet the inspection requirements of CSPs. These requirements include not only the critical inspection of the balls, but also inspection of the surface„to check for a chipped device with exposed silicon, for example.

The CI-8250 is designed for high volume, high-speed inspection, including top and bottom surface and mark inspection, 2D and 3D ball inspection and taping.

The system's software enables quick and easy changeovers within minutes, according to the company. The CI-3050, a converted lead inspector, is semi-automatic with a small footprint and is geared toward low volume production inspection., incoming inspection, process control and QA/QC inspection.

ICOS Vision Systems Corp. N.V., Research Park Haasrode, Zone 1, Esperantolaan 9, 3001 Heverlee, Belgium, +32.16.39.82.20, fax +32.16.40.00.67.



Chip Scale Review o 7291 Coronado Drive, Suite 8 o San Jose, CA 95129 o Email: editor@chipscalereview.com



Products, 98/10/01, 05/13/99, ID=9809/product5
Keywords=at00 fi00

© 1998 ChipScale REVIEW