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Current Issue
An Independent Journal Dedicated to the Advancement of Chip - Scale Electronics
October 2001

Tech Forum: Effects of Pb Contamination on Lead-Free Sn/Ag/Cu/Bi/In and Sn/Cu/In/Ga Systems

Exclusive Series, Part 7 of 8

ABSTRACT
Sn/Pb solder is commonly used as a surface coating on component leads and on PWB pads. Today, however, many people are concerned about possible Pb contamination in lead-free solders during the manufacture of circuit assemblies. In the conclusion of this series, the authors discuss the effects of a trace amount of Pb on lead-free alloys, which were added to optimally lead-free compositions of two separate systems.

By Drs. Jennie S. Hwang and Zhenfeng Guo, H-Technologies Group Inc., Cleveland, Ohio

When a lead-free solder alloy is soldered onto the Pb-containing surface, Pb will contaminate the lead-free solder alloy through a metallurgical reaction. This represents fundamentally a secondary alloying process that is almost instantaneous under common soldering conditions.

We investigated the effects of Pb contamination in lead-free Sn/Ag/Cu/Bi/In and Sn/Cu/In/Ga solder by intentionally doping the lead-free solder with a small amount of Pb. In our study, we have examined a Pb dosage that accounts for up to 0.5% of the surface coating.

Experimental

The experimental protocol and test procedures are same as outlined in Part 1 (Chip Scale Review, January/February 2001).

Results for the SnAgBiCuIn System*

Pb at 0.1%, 0.2% and 0.5% was added to the optimum lead-free solder composition (alloy 322: 82.3Sn/3Ag/2.2Bi/0.5Cu/ 12In) as representative of a Sn/Ag/Bi/ Cu/In system.

The resulting solder compositions, along with their melting temperatures (Tm), yielded strengths (σy), tensile strengths (σTS), Young's modulus (E), plastic strains (εp) at fracture and fatigue lives (Nf) at a total strain range of 0.2%, and are summarized in Table 1. All compositions are expressed in weight percent, unless otherwise specified. (Also included in Table 1 is the reference alloy of 63Sn/37Pb.)

Table 1. Compositions and Properties of Pb-Contaminated Lead-Free Sn/Ag/Cu/Bi/In Solders
  Sn Cu Ag Bl In Sb Ga Pb Tm σy* σTS* E* εp* NI*
322 82.3 0.5 3 2.2 12 - - - 183-193 40 73 46 11 7266
322+ 81.8 0.5 3 2.2 12 - - 0.5 184-194 43 73 39 7 4239
321 82.1 0.5 3 2.2 12 - - 0.2 183-193 48 79 54 10 2492
3222 82.2 0.5 3 2.2 12 - - 0.1 183-193 41 76 47 11 2102
63/37 63 - - - - - - 37 183 41 47 27 24 3650
Notes: 1. Tm: melting temperature (°C); σy: 0.2% offset yield strength (MPa);σTS: tensile strength (MPa); E: Young’s modulus (GPa); εp: plastic strain at fracture (%); Nf: number of cycles to failure (50% load drop, 0.2% strain range).

Melting Temperature

As seen in Table 1, the addition of small amounts of Pb caused no notable influence on the alloy melting temperatures.

Strength and Plasticity

Figure 1 compares the tensile stress (σ) vs. strain (ε) curves of SnAgBiCuIn alloys with and without Pb contamination. When Pb was added to alloy 322: 82.3Sn/3Ag/2.2Bi/ 0.5Cu/12In, there was no significant effect on alloy strength, nor on the plasticity.

Low-Cycle Fatigue Life

The presence of lead in an Sn/Ag/Cu/ Bi/In system largely reduced the low-cycle fatigue life (Nf). However, the fatigue life of the Pb-contaminated solder in the Sn/Ag/Cu/Bi/In system was still higher than that of 63Sn/37Pb (Table 1).

Results for the SnCuInGa System*

Pb at 0.1 %, 0.2 % and 0.5 % was added to the optimum lead-free solder composition (alloy 719: 92.8Sn/0.7Cu/6In/0.5Ga) as representative of a Sn/Cu/In/Ga system. The testing results are summarized in Table 2 with the reference alloy of 63Sn/37Pb.

Table 2. Compositions and Properties of Pb-Contaminated Lead-Free Sn/Cu/In/Ga Solder
  Sn Cu Ag Bl In Sb Ga Pb Tm σy* σTS* E* εp* NI*
719 92.8 0.7 - - 6 - 0.5 - 210-215 53 58 47 28 10800
719+ 92.3 0.7 - - 6 - 0.5 0.5 211-216 56 62 44 16 3729
7191 92.6 0.7 - - 6 - 0.5 0.2 211-216 62 69 50 16 1552
7192 92.7 0.7 - - 6 - 0.5 0.1 211-216 61 64 43 11 1968
63/37 63 - - - - - - 37 183 41 47 27 24 3650
* Tm: melting temperature (°C); σy: 0.2% offset yield strength (MPa); σTS: tensile strength (MPa); E: Young’s modulus (GPa); εp: plastic strain at fracture (%); Nf: number of cycles to failure (50% load drop, 0.2% strain range).

Melting Temperature

As seen in Table 2, the addition of Pb in small amounts produced no notable difference on the alloy melting temperatures.

Strength and Plasticity

Figure 2 compares the tensile stress (σ) vs. strain (ε) curves of SnCuInGa alloys with and without Pb contamination. When Pb was added to alloy 719, there was no apparent effect on alloy strength, but alloy plasticity was largely reduced.

Low-Cycle Fatigue Life

The presence of lead in the Sn/Cu/In/Ga system reduced the low-cycle fatigue life (Nf).

Summary and Conclusion

The contamination of Pb up to 0.5% in 82.3Sn/3Ag/2.2Bi/0.5Cu/12In produced no apparent effect on the alloy melting temperature. Its impact on the strength and plasticity of the Sn/Ag/Cu/Bi/In composition is also negligible. However, the Pb addition reduced the alloy fatigue life.

Nevertheless, the fatigue life of the Pb-contaminated alloy in Sn/Ag/Cu/Bi/In system is still higher than that of 63Sn/37Pb.

The contamination of Pb up to 0.5% in alloy 719: 92.8Sn/0.7Cu/6In/0.5Ga produced no apparent change on the alloy melting temperature. Its impact on the strength of Sn/Cu/In/Ga composition is also negligible. However, the Pb addition reduced the alloy plasticity and fatigue life.

* J.S. Hwang, Environment-Friendly Electronics: Lead-Free Technology, Electrochemical Publications, Great Britain, 2001.

Dr. Jennie S. Hwang

Dr. Hwang is a member of the National Academy of Engineering, and is internationally known for her work in SMT manufacturing. She has written more than 180 publications and several internationally adopted textbooks. Her newest book, Environment-Friendly Elec-tronics: Lead-Free Technology, was released in August. Dr. Guo is a research scientist. [jslhwang@aol.com]

 
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