January - February 1999
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Aehr Test Systems Intros ATX2 Burn-In Unit
Aehr Test Systems has introduced the ATX2 monitored burn-in system, with a flexible design aimed at high pincount ICs.The system offers 256 I/O channels and deep vector memory for burn-in of complex logic devices. Different types of IC can be burned-in on a single run.
The ATX2 is the newest addition to Aehr Test's ATX family. It includes the same core features of the ATX3200 model, including advanced pattern generation and 32 independent electrical zones for simultaneous burn-in of multiple devices types.
The ATX2 boasts reconfigurable vector memory that allows 2 Mb deep pattern generation for normal 256 channel operation or 24 Mb deep for four-channel boundary scan applications.
Aehr Test Systems, 1667 Plymouth st., Mountain View, CA 94043, 650.691.9400, fax 650.691.9300.