CSR Tech Monthly Feature Article
BiTS takes a Byte out of Test
Attendees of the 14th annual Burn-in and Test Strategies (BiTS) Workshop held in Mesa, AZ on March 3-6, 2013 were once again treated to a variety of excellent programs focused on the burn-in and test of integrated circuits. Attendance continued to be strong. There were 361 total participants, which included conference attendees, exhibitor staff, and exhibits-only visitors.
The event kicked off with a 3-hour Tech Talk titled "Thermal and Mechanical Challenges for Test Handlers" by Jerry Tustaniwskyj, PhD, Director of Technology Development at Delta Design, Inc. It was followed by a 3-hour Tutorial titled "Package Test is a Dirty Business" by Jerry Broz, PhD from International Test Solutions describing socket cleaning strategies to reduce the cost of test and improve the overall equipment effectiveness. The first day drew to a close with the Socket Market Report by Fred Taber of Taber Consulting.
Fred Taber, the General Chair and Test Technology Consultant, and his distinguished organizing committee have diligently worked to improve this event year after year. This year they video recorded all of the presentations and made the slides and audio available to the registered attendees as a supplement to the published technical papers.
The second day opened with the Keynote Address titled "The Dramatic Restructuring of the Integrated Circuit Industry" by Bill McClean, President of IC Insights, Inc. McClean described their new "tops down" forecasting model for the semiconductor industry which is now tied closely to the growth in global Gross Domestic Product (GDP). After emerging from a lackluster 2.0% growth rate during 2007 – 2012, he expects the IC industry CAGR to more than triple to 7.4% in the next 5-year period.
Bill McClean of IC Insights delivering the Keynote Address. Photograph: courtesy of BiTS Workshop, LLC
Attendees enjoyed 29 technical presentations from test industry leaders organized in 7 sessions over 2-1/2 days, including a poster session and a panel discussion titled "Interconnectology: Inspiring a Paradigm Shift" hosted by Francoise von Trapp, the Founder of 3D InCites. The panelists were Scott Jewler of Advanced Nanotechnology Solutions, Chris Scanlan of Deca Technologies, Dr. Sitaram Arkalgud of Invensas, and Ira Feldman of Feldman Engineering.
Talking Points 'talk show', hosted by (right) Francoise von Trapp (of 3D InCites & Impress Labs), with guests (l to r) Scott Jeweler (Senior VP, Advanced Nanotechnology Solutions, Inc.), Sitaram Arkalgud (Director of 3D Technologies, Invensas Corp.), Chris Scanlan (VP Product Development, Deca Technologies). Not Shown is guest Ira Feldman (President & CEO, Feldman Engineering Corp.) Photograph: courtesy of BiTS Workshop, LLC
Carol McCuen (center) of R&D Circuits receives the Attendee Choice award from (left) Fred Taber, BiTS Workshop General Chairman and Mike Noel of Freescale and the BiTS Workshop Technical Program Chair. Photograph: courtesy of BiTS Workshop, LLC
Many new products and services were on display and described by representatives from the 52 companies in the Exhibit Hall over the course of two days. Principal sponsors were Test Tooling Solutions, Teradyne, Interconnect Devices, RD Circuits, Sensata Technologies, and Chip Scale Review. Networking was encouraged amongst the international crowd during the breaks, receptions, and the western-theme "Wrangler Roundup" dinner.
BiTS EXPO, Multitest booth. L to R: Jim Brandes, Kim Barrett, Tony DeRosa, Bob Chartrand (all of Multitest) Photograph: courtesy of BiTS Workshop, LLC
BiTS EXPO, IDI booth. L to R: Jeff Tamasi, Kim Hause, Jon Diller, Tim Dowdle,(all of Interconnect Devices Inc.)Photograph: Chip Scale Review
Fred Taber summarized it best, "BiTS 2013 was a very successful workshop, with a strong technical program highlighted by the Keynote Address delivered by Bill McClean of IC Insights and the Talking Points 'talk show' hosted by Francoise von Trapp of 3D InCites, plus the EXPO was sold out and then expanded to accommodate additional exhibitors." Planning has already begun for the next BiTS Workshop to be held on March 9 – 12, 2014.
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