November - December 1999 - ChipScale Review

November - December 1999


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Directory Table

RDRAM Sockets Supplier Directory

Company Model Number Pitch (mm) I/O Description Contact
Aehr Test Systems
1667 Plymouth Street
Mountain View, CA 94043
DiePak reusable carriers and sockets for burn-in and test   108, 172 and 324 pin carriers and burn-in sockets Reusable carriers with standardized sockets for each carrier, which eliminates need for separate burn-in board for each device type. Rick Pendergrass
650.691.9400, 650.691.9300
www.aehr.com
Everett Charles Technologies
Semiconductor Test Group
3020 South Park Drive
Tempe, AZ 85282
BantamPak™ 0.75 2,000 points (no limit found, currently testing 1,400) 10 GHz bandwidth with less than -1db attenuation coupled with .030 in compliance and a quick reload pallet system.

Short, low inductance, compliant Pogo pins with various tips.

Darren Nill, Sales Manager
408.894.9400, fax 408.894.9292
nilld@ectinfo.com
www.ectinfo.com
Semiconductor Test Group UK
44.1522.548220
Johnstech International Corp.
1210 New Brighton Blvd.
Minneapolis, MN 55413
1934 0.75 74 Rambus validation, edge bond Randy Knudsen,
Product Manager
612.378.2020, fax 612.378.2030
www.johnstech.com
2014 0.80 x 1.0 54/62 Rambus validation, center bond
2166 0.75 74 Multi-site, multi-tester platforms, Delta Castle
2223   54/62 Multi-site, multi-tester platforms, Delta Castle
Liberty Research Inc.
2938 Scott Blvd.,
Santa Clara, CA 95054
JITRMBS-74-0.75 0.75 74 Burn-in socket, 74 contacts, uses side pincers for contact. Jason Langston, Marketing
408.727.5980, fax 408.727.5950
info@liberty-research.com
www.liberty-research.com
JITRMBS-62-0.8, 1.0   62 Burn-in socket, 62 contacts, uses side pincers
BARMBS-74-0.75 0.75 74 Test socket, <0.5nH
BARMBS-62-0.8, 1.0   62 Test socket, uses MT Matrix polymer
Loranger International
817 Fourth Ave.
Warren, PA 16365
11708962U6617 0.80 x 1.0 62   Ariane Loranger
814.723.2250, fax 814.723.5391
licsales@loranger.com
www.loranger.com
OZ TEK Inc.
3387 Investment Blvd.
Hayward, CA 94545
HP 9500 RDRAM Auto Test Contactor 0.75 64 The OZ TEK i2™ test socket system combines interchangeable inserts and spring-loaded probe contacts to produce a very accurate and reliabile high-speed signal path. Bruce Rogers,
Vice President of Sales and Marketing
510.782.2654, fax 510.782.2656
info@oztek.com
www.oztek.com
PrimeYield Systems Inc.
4837 White Bear Parkway
St. Paul, MN 5511

UHPC/GA (designed to order) 0.5 unlimited Low inductance, high bandwidth, using contact element array and compliant, conductive interposer

Jim Brandes, Product Manager
651.407.7726, fax 651.407.7290
www.primeyield.com
Synergetix
310 South 51st St.
Kansas City, KS 66106
Ultra Performance Test Sockets Down to 0.25 unlimited Low contact force, four-pointed crown contact geometry and high-cycle life, spring-loaded contact technology

Joe Bunch, Product Specialist
913.342.0404, fax 913.342.6623
info@synerget.com
Stan Wilson, UK
Stangw@ibm.net

Don Di Nuccio, Hong Kong
Donhk@aol.com
www.synerget.com
Tecknit Interconnection Products,
129 Dermody St.
Cranford, NJ 07016

33-25000 Series Down to 0.5 400 Low parasitics, high actuation levels. Sockets use Fuzz Button™ and HardHat™ as the interconnect media.

Bill Richline
Sales & Marketing Manager
908.500.0092, fax 800.443.1085
wrichline@tecknit.com
www.tecknit.com

Yamaichi Electronics USA Inc.
(Division of Yamaichi Electronics Co. Ltd.)
3-28-7 Nakamagome, Ohta-ku,
Tokyo, Japan
2235 Zanker Rd.
San Jose, CA 95131
NP367


NP291
0.8 x 1.0


0.75
54-620


54-62
Tweezer style contacts, removeable guide plates to accommodate different configurations with latches for different package thicknesses. Frank Lessani, Project Manager
408.456.0797 x123, fax 408.456.0799
frank.l@yeu.com
Yamaichi Electronics Deutschland GmbH, Karl-Schmid-9 Strasse, Munich
www.yeu.com
www.yamaichi.co.jp (Japanese)
Texas Instruments
Interconnection Business
111 Forbes Blvd.
Mansfield, MA 02048
CBG and FBGA socket families 0.75, 1.0 x 0.8, 1.27 52, 62, 74 (higher and lower for custom applications) High-volume capable design utilizes ZIF, open-top with a pinch-style contact. Ed Craig, Sales & Marketing Manager
508.236.5202, fax 508.236.5339
ecraig@ti.com
Texas Instruments France
33.13.070.1105, 33.13.070.1277 fax

Texas Instruments Singapore Ltd./Asia
Pacific Region
65.833.6007, fax 65.833.6063
www.ti.com/mc/igb
3M Electronic Handling and Protection Division (acquired Tronix)
4908 East McDowell Rd.
Phoenix, AZ 85008
BGA112-.75-CH Hand Test Socket


BGA126-.8X1-CH Hand Test Socket
0.75


0.8 x 1.0
  Electrical capability of 10 GHz with low inductance/capacitance due to very short contact lead length. Uses proprietary contacting system

with conductive elastomer for compliance.

Gerald Anderson, MicroTouch Market Development
602.220.0006, fax 602.220.0011
amamktg@airmail.net
www.3m.com/ehpd

Wells-CTI
52940 Olive Rd.
South Bend, IN 46628
706 Series 0.8 x 1.0 108 (maximum) Open top ZIF, four-point pitch contact John Hartstein, Marketing Manager, Memory Products
219.287.5941 x278, fax 219.287.0356
www.wellscti.com

* All data appearing above was supplied by vendors, and Chip Scale Review makes no representation as to its accuracy. Advertisers are listed in bold face type.



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